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v0.7.6: Ptycho+XRF Demo (#101)
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@stevehenke stevehenke released this 24 Oct 02:08
· 2 commits to master since this release
v0.7.6
c65a130
This commit was created on GitHub.com and signed with GitHub’s verified signature.
GPG key ID: B5690EEEBB952194
Learn about vigilant mode.
  • Added file readers for LCLS XPP instrument
  • Implemented VSPI algorithm for ptycho-enhanced XRF
  • Added BDP hooks for ptycho-enhanced XRF
  • Extracted reconstructor API
  • Added APS S31 batch reconstruction workflow
  • Added Ptychoshelves product file reader
  • Implemented fix needed to support numpy 2.0
  • Added workflow to auto-load product files as they appear
  • Cleaned up timers
  • Fixed crash when selecting zero-sized region with rectangle tool
  • Refactored settings classes to use parametric classes
  • Refactor Tike GUI to use parametric view controllers
  • Enable syncing product/scan/probe/object parameters to settings
  • Make default product name configurable and validate renaming
  • Implemented requested GUI change: Start on diffraction patterns view
  • Implemented requested GUI change: Renamed HDF5 diffraction file reader
  • Implemented requested GUI change: Prompt user to choose diffraction file format
  • Reformatted repository using ruff format
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